Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9679209 | State monitoring apparatus | Takuhiro Omi | 2017-06-13 |
| 9658808 | Printing system, printing control method in cluster environment, and printing control program | Masatoshi Tanaka, Ko Shimazawa, Takahiro Sakimoto | 2017-05-23 |
| 9658809 | Printing system, printing control method in cluster environment, and printing control program | Masatoshi Tanaka, Ko Shimazawa, Takahiro Sakimoto | 2017-05-23 |
| 9588725 | Printing system, printing control method in cluster environment, and printing control program | Masatoshi Tanaka, Ko Shimazawa, Takahiro Sakimoto | 2017-03-07 |
| 9564315 | Manufacturing method and apparatus for manufacturing silicon carbide epitaxial wafer | Akihito Ohno, Masashi Sakai, Yoichiro Mitani, Yasuhiro Kimura, Takuma Mizobe +1 more | 2017-02-07 |