Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9449788 | Enhanced defect detection in electron beam inspection and review | Kumar Raja Guvindan Raju, Wade Lenn Jensen, Hong Xiao, Lorraine Ellen Young | 2016-09-20 |
| 9257260 | Method and system for adaptively scanning a sample during electron beam inspection | David Chen, Vivekanand Kini, Hong Xiao | 2016-02-09 |