Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9257260 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Hong Xiao | 2016-02-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9257260 | Method and system for adaptively scanning a sample during electron beam inspection | Gary Fan, David Chen, Hong Xiao | 2016-02-09 |