Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9460502 | Defect inspection apparatus using images obtained by optical path adjusted | Takeshi Fujiwara | 2016-10-04 |
| 9406117 | Inspection system and method for inspecting line width and/or positional errors of a pattern | Takanao Touya, Shuichi Tamamushi, Hidenori Sato, Hiroyuki Tanizaki, Takeshi Fujiwara +4 more | 2016-08-02 |
| 9290971 | Door device for vehicle | Toyohisa Amagai, Kinji Hoshikawa | 2016-03-22 |