Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9508611 | Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor element | Yoshinobu Kimura, Hiroya Ohta, Renichi Yamada, Hirotaka Hamamura, Toshiyuki Ohno +2 more | 2016-11-29 |
| 9236220 | Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope | Hideyuki Kazumi, Takafumi Miwa, Yoshinobu Kimura, Hajime Kawano | 2016-01-12 |