Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9508611 | Semiconductor inspection method, semiconductor inspection device and manufacturing method of semiconductor element | Yoshinobu Kimura, Natsuki Tsuno, Hiroya Ohta, Renichi Yamada, Toshiyuki Ohno +2 more | 2016-11-29 |
| 9318558 | MOS field effect transistor | Toshiyuki Mine, Yasuhiro Shimamoto | 2016-04-19 |