Issued Patents 2016
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9377508 | Selective per-cycle masking of scan chains for system level test | Dariusz Czysz, Grzegorz Mrugalski, Nilanjan Mukherjee, Jerzy Tyszer | 2016-06-28 |
| 9347993 | Test generation for test-per-clock | Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski | 2016-05-24 |
| 9335374 | Dynamic shift for test pattern compression | Xijiang Lin, Mark Kassab | 2016-05-10 |
| 9335377 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski | 2016-05-10 |
| 9250287 | On-chip comparison and response collection tools and techniques | Nilanjan Mukherjee, Jerzy Tyszer | 2016-02-02 |