Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9347993 | Test generation for test-per-clock | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski | 2016-05-24 |
| 9335377 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski | 2016-05-10 |