Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9377508 | Selective per-cycle masking of scan chains for system level test | Janusz Rajski, Dariusz Czysz, Nilanjan Mukherjee, Jerzy Tyszer | 2016-06-28 |
| 9347993 | Test generation for test-per-clock | Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer | 2016-05-24 |
| 9335377 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer | 2016-05-10 |