Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9507907 | Computational wafer inspection | Christophe David Fouquet, Arie Jeffrey Den Boef, Johannes Catharinus Hubertus Mulkens, James Benedict Kavanagh, James Patrick Koonmen +1 more | 2016-11-29 |
| 9229336 | Lithographic apparatus and methods for determining an improved configuration of a lithographic apparatus | Jozef Maria Finders, Sander De Putter | 2016-01-05 |