Issued Patents 2016
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9529046 | Partitioned scan chain diagnostics using multiple bypass structures and injection points | Michael J. Hamilton, Amanda R. Kaufer | 2016-12-27 |
| 9429622 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Michael J. Hamilton, Amanda R. Kaufer | 2016-08-30 |
| 9429621 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Michael J. Hamilton, Amanda R. Kaufer | 2016-08-30 |
| 9404969 | Method and apparatus for efficient hierarchical chip testing and diagnostics with support for partially bad dies | Brion Keller, Mary P. Kusko | 2016-08-02 |
| 9378318 | Shared channel masks in on-product test compression system | Mary P. Kusko | 2016-06-28 |
| 9372232 | Collecting diagnostic data from chips | Ryan A. Fitch, William V. Huott, Mary P. Kusko | 2016-06-21 |
| 9366723 | Test coverage of integrated circuits with masking pattern selection | Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer | 2016-06-14 |
| 9355203 | Shared channel masks in on-product test compression system | Mary P. Kusko | 2016-05-31 |
| 9297856 | Implementing MISR compression methods for test time reduction | Mary P. Kusko, Cedric Lichtenau | 2016-03-29 |
| 9285423 | Managing chip testing data | Ryan A. Fitch, William V. Huott, Mary P. Kusko | 2016-03-15 |