| 9529046 |
Partitioned scan chain diagnostics using multiple bypass structures and injection points |
Michael J. Hamilton, Amanda R. Kaufer |
2016-12-27 |
| 9429622 |
Implementing enhanced scan chain diagnostics via bypass multiplexing structure |
Michael J. Hamilton, Amanda R. Kaufer |
2016-08-30 |
| 9429621 |
Implementing enhanced scan chain diagnostics via bypass multiplexing structure |
Michael J. Hamilton, Amanda R. Kaufer |
2016-08-30 |
| 9404969 |
Method and apparatus for efficient hierarchical chip testing and diagnostics with support for partially bad dies |
Brion Keller, Mary P. Kusko |
2016-08-02 |
| 9378318 |
Shared channel masks in on-product test compression system |
Mary P. Kusko |
2016-06-28 |
| 9372232 |
Collecting diagnostic data from chips |
Ryan A. Fitch, William V. Huott, Mary P. Kusko |
2016-06-21 |
| 9366723 |
Test coverage of integrated circuits with masking pattern selection |
Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer |
2016-06-14 |
| 9355203 |
Shared channel masks in on-product test compression system |
Mary P. Kusko |
2016-05-31 |
| 9297856 |
Implementing MISR compression methods for test time reduction |
Mary P. Kusko, Cedric Lichtenau |
2016-03-29 |
| 9285423 |
Managing chip testing data |
Ryan A. Fitch, William V. Huott, Mary P. Kusko |
2016-03-15 |
