Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9529046 | Partitioned scan chain diagnostics using multiple bypass structures and injection points | Steven M. Douskey, Amanda R. Kaufer | 2016-12-27 |
| 9429621 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Steven M. Douskey, Amanda R. Kaufer | 2016-08-30 |
| 9429622 | Implementing enhanced scan chain diagnostics via bypass multiplexing structure | Steven M. Douskey, Amanda R. Kaufer | 2016-08-30 |
| 9366723 | Test coverage of integrated circuits with masking pattern selection | Steven M. Douskey, Ryan A. Fitch, Amanda R. Kaufer | 2016-06-14 |