Issued Patents 2016
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9506983 | Chip authentication using scan chains | Franco Motika, Dirk Pfeiffer | 2016-11-29 |
| 9448277 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Franco Stellari | 2016-09-20 |
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Alan J. Weger | 2016-06-21 |
| 9337837 | Physical unclonable function generation and management | Dirk Pfeiffer, Jean-Olivier Plouchart | 2016-05-10 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Alan J. Weger | 2016-02-16 |