Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2016-06-21 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2016-02-16 |