Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9448277 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Peilin Song | 2016-09-20 |
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Alan J. Weger, Peilin Song | 2016-06-21 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Alan J. Weger, Peilin Song | 2016-02-16 |
| 9229044 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Alan J. Weger | 2016-01-05 |