Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9372231 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2016-06-21 |
| 9310429 | Method and apparatus for probing a wafer | Stephen Bradley Ippolito | 2016-04-12 |
| 9261561 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2016-02-16 |
| 9229044 | Minimum-spacing circuit design and layout for PICA | Herschel A. Ainspan, Seongwon Kim, Franco Stellari | 2016-01-05 |