Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9395403 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2016-07-19 |
| 9299623 | Run-to-run control utilizing virtual metrology in semiconductor manufacturing | Robert J. Baseman, Jingrui He, Yada Zhu | 2016-03-29 |
| 9240360 | Run-to-run control utilizing virtual metrology in semiconductor manufacturing | Robert J. Baseman, Jingrui He, Yada Zhu | 2016-01-19 |