Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9235141 | Inspection apparatus and method for measuring a property of a substrate | Maurits Van Der Schaar, Arie Jeffrey Den Boef, Everhardus Cornelis Mos, Andreas Fuchs, Hendrik Jan Hidde Smilde | 2016-01-12 |