Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8055056 | Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same | Jong-An Kim, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2011-11-08 |
| 8055057 | Method for detecting defects in a substrate having a semiconductor device thereon | Moon-Shik Kang, Jong-An Kim, Myung-Sub Lee, Ji Hye Kim | 2011-11-08 |
| 8050488 | Method of analyzing a wafer sample | Jong-An Kim, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2011-11-01 |
| 8034640 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Jong-An Kim, Hyung-Suk Cho | 2011-10-11 |
| 8034641 | Method for inspection of defects on a substrate | Woo-Seok Ko, Chung-Sam Jun, Hyung-Su Son | 2011-10-11 |