Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8034640 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Jong-An Kim, Yu-Sin Yang | 2011-10-11 |
HC
Hyung-Suk Cho
Overall (2011): #281,493 of 364,097Top 80%
1
Patents 2011