Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8055056 | Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same | Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2011-11-08 |
| 8055057 | Method for detecting defects in a substrate having a semiconductor device thereon | Moon-Shik Kang, Myung-Sub Lee, Yu-Sin Yang, Ji Hye Kim | 2011-11-08 |
| 8050488 | Method of analyzing a wafer sample | Yu-Sin Yang, Chung-Sam Jun, Moon-Shik Kang, Ji Hye Kim | 2011-11-01 |
| 8034640 | Apparatus and method to inspect defect of semiconductor device | Ji-Young Shin, Young-Nam Kim, Hyung-Suk Cho, Yu-Sin Yang | 2011-10-11 |