Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8055056 | Method of detecting defects of patterns on a semiconductor substrate and apparatus for performing the same | Jong-An Kim, Yu-Sin Yang, Moon-Shik Kang, Ji Hye Kim | 2011-11-08 |
| 8050488 | Method of analyzing a wafer sample | Jong-An Kim, Yu-Sin Yang, Moon-Shik Kang, Ji Hye Kim | 2011-11-01 |
| 8034641 | Method for inspection of defects on a substrate | Woo-Seok Ko, Hyung-Su Son, Yu-Sin Yang | 2011-10-11 |