Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8051341 | Semiconductor memory device having test address generating circuit and method of testing semiconductor memory device having a test address generating circuit | Hyung-Dong Kim, Woo-II Kim | 2011-11-01 |
| 7941714 | Parallel bit test apparatus and parallel bit test method capable of reducing test time | Kwun-Soo Cheon, Hyun-Soon Jang, Seung-whan Seo | 2011-05-10 |