Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7941714 | Parallel bit test apparatus and parallel bit test method capable of reducing test time | Yong-Hwan Cho, Kwun-Soo Cheon, Seung-whan Seo | 2011-05-10 |
| 7868438 | Multi-chip package for reducing parasitic load of pin | Byung-Se So, Dong-Ho Lee | 2011-01-11 |