Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7941714 | Parallel bit test apparatus and parallel bit test method capable of reducing test time | Yong-Hwan Cho, Hyun-Soon Jang, Seung-whan Seo | 2011-05-10 |
KC
Kwun-Soo Cheon
Overall (2011): #238,596 of 364,097Top 70%
1
Patents 2011