Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7941714 | Parallel bit test apparatus and parallel bit test method capable of reducing test time | Yong-Hwan Cho, Kwun-Soo Cheon, Hyun-Soon Jang | 2011-05-10 |
SS
Seung-whan Seo
Overall (2011): #169,795 of 364,097Top 50%
1
Patents 2011