Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8043966 | Method for monitoring patterning integrity of etched openings and forming conductive structures with the openings | Toshiharu Furukawa, William R. Tonti | 2011-10-25 |
| 7993999 | High-K/metal gate CMOS finFET with improved pFET threshold voltage | Kangguo Cheng, Bruce B. Doris, Johnathan E. Faltermeier, Ali Khakifirooz | 2011-08-09 |
| 7944006 | Metal gate electrode stabilization by alloying | Hariklia Deligianni, Rajarao Jammy, Vamsi K. Paruchuri, Lubomyr T. Romankiw | 2011-05-17 |
| 7935621 | Anti-fuse device structure and electroplating circuit structure and method | Toshiharu Furukawa, William R. Tonti | 2011-05-03 |
| 7868410 | Gate stack engineering by electrochemical processing utilizing through-gate-dielectric current flow | Philippe M. Vereecken, Cyril Cabral, Jr., Emanuel I. Cooper, Hariklia Deligianni, Martin M. Frank +4 more | 2011-01-11 |