Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8020120 | Layout quality gauge for integrated circuit design | Fook-Luen Heng, Mark A. Lavin, Jin-Fuw Lee, Rama Nand Sing, Fanchieh Yee | 2011-09-13 |
| 7990158 | Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters | Helmut Schettler, Thomas-Michael Winkel | 2011-08-02 |
| 7962877 | Port assignment in hierarchical designs by abstracting macro logic | Joachim Keinert, Juergen Koehl | 2011-06-14 |