Issued Patents 2011
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7990158 | Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters | Thomas Ludwig, Thomas-Michael Winkel | 2011-08-02 |
HS
Helmut Schettler
Overall (2011): #288,563 of 364,097Top 80%
1
Patents 2011