Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8020120 | Layout quality gauge for integrated circuit design | Fook-Luen Heng, Mark A. Lavin, Thomas Ludwig, Rama Nand Sing, Fanchieh Yee | 2011-09-13 |
| 7962865 | System and method for employing patterning process statistics for ground rules waivers and optimization | Fook-Luen Heng, Mark A. Lavin, Chieh-Yu Lin, Jawahar P. Nayak, Rama N. Singh | 2011-06-14 |