Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8084864 | Electromigration resistant aluminum-based metal interconnect structure | Jonathan D. Chapple-Sokol, Zhong-Xiang He, Tom C. Lee, William J. Murphy, Timothy D. Sullivan +2 more | 2011-12-27 |
| 8003536 | Electromigration resistant aluminum-based metal interconnect structure | Jonathan D. Chapple-Sokol, Zhong-Xiang He, Tom C. Lee, William J. Murphy, Timothy D. Sullivan +2 more | 2011-08-23 |