Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8044352 | Electron microscopy | Kotaro Hosoya, Isao Nagaoki | 2011-10-25 |
| 8030614 | Charged particle beam apparatus and dimension measuring method | Mitsugu Sato, Katsuhiko Sakai, Atsushi Takane | 2011-10-04 |
| 7973282 | Charged particle beam apparatus and dimension measuring method | Mitsugu Sato, Katsuhiko Sakai, Atsushi Takane | 2011-07-05 |
| 7940324 | Method of exposure control and image pickup apparatus | Yutaka Hibino, Masataka Furuya | 2011-05-10 |
| 7922164 | Sheet finishing device and image forming apparatus | — | 2011-04-12 |