Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8045148 | System for monitoring foreign particles, process processing apparatus and method of electronic commerce | Hidetoshi Nishiyama, Minori Noguchi, Tetsuya Watanabe | 2011-10-25 |
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shuichi Chikamatsu +4 more | 2011-05-31 |