KA

Kenji Aiko

HH Hitachi High-Technologies: 1 patents #207 of 523Top 40%
Overall (2011): #248,130 of 364,097Top 70%
1
Patents 2011

Issued Patents 2011

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7953567 Defect inspection apparatus and defect inspection method Kei Shimura, Minori Noguchi, Masaaki Ito, Shuichi Chikamatsu, Shigeo Otsuki +4 more 2011-05-31