Issued Patents 2011
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7953567 | Defect inspection apparatus and defect inspection method | Kei Shimura, Minori Noguchi, Masaaki Ito, Kenji Aiko, Shigeo Otsuki +4 more | 2011-05-31 |
| 7940383 | Method of detecting defects on an object | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more | 2011-05-10 |