Issued Patents 2011
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8050490 | Method for inspecting overlay shift defect during semiconductor manufacturing and apparatus thereof | Wei Fang, Jack Jau | 2011-11-01 |
| 8010307 | In-line overlay measurement using charged particle beam system | Wei Fang, Jack Jau | 2011-08-30 |
| 7981243 | Method of manufacturing laminated damping structure with vulcanized rubber as viscoelastic core | — | 2011-07-19 |
| 7919760 | Operation stage for wafer edge inspection and review | Jack Jau, Joe Wang, Zhongwei Chen, Yi Wang, Edward Tseng | 2011-04-05 |
| 7916891 | Apparatus for measurement of floating body posture of person wearing life jacket | Hong Zhou, Meiwu Shi, Fei Duan, Shiliang Dai, Jinyu Zhu | 2011-03-29 |