Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8013599 | Methods and apparatus for testing a component | Ui Suh, Gigi Gambrell, John Ertel | 2011-09-06 |
| 7994780 | System and method for inspection of parts with an eddy current probe | Haiyan Sun, Changting Wang | 2011-08-09 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, Ui Suh | 2011-05-31 |
| 7888932 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | Ui Suh, Yuri Alexeyevich Plotnikov, Changting Wang, Ralph Gerald Isaacs | 2011-02-15 |