Issued Patents 2011
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7994780 | System and method for inspection of parts with an eddy current probe | Changting Wang, William Stewart McKnight | 2011-08-09 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Yuri Alexeyevich Plotnikov, Changting Wang, William Stewart McKnight, Ui Suh | 2011-05-31 |
| 7883893 | Method to assay test substances | Min Li, Sojin Shikano | 2011-02-08 |