Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8013599 | Methods and apparatus for testing a component | Gigi Gambrell, John Ertel, William Stewart McKnight | 2011-09-06 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Haiyan Sun, Yuri Alexeyevich Plotnikov, Changting Wang, William Stewart McKnight | 2011-05-31 |
| 7948233 | Omnidirectional eddy current array probes and methods of use | Aparna Chakrapani Sheila-Vadde, Changting Wang | 2011-05-24 |
| 7888932 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | William Stewart McKnight, Yuri Alexeyevich Plotnikov, Changting Wang, Ralph Gerald Isaacs | 2011-02-15 |