Issued Patents 2011
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7994780 | System and method for inspection of parts with an eddy current probe | Haiyan Sun, William Stewart McKnight | 2011-08-09 |
| 7952348 | Flexible eddy current array probe and methods of assembling the same | Haiyan Sun, Yuri Alexeyevich Plotnikov, William Stewart McKnight, Ui Suh | 2011-05-31 |
| 7948233 | Omnidirectional eddy current array probes and methods of use | Aparna Chakrapani Sheila-Vadde, Ui Suh | 2011-05-24 |
| 7888932 | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same | William Stewart McKnight, Ui Suh, Yuri Alexeyevich Plotnikov, Ralph Gerald Isaacs | 2011-02-15 |