EP

Engelbertus Antonius Fransiscus Van Der Pasch

AB Asml Netherlands B.V.: 2 patents #76 of 377Top 25%
📍 Oirschot, NL: #3 of 5 inventorsTop 60%
Overall (2011): #102,020 of 364,097Top 30%
2
Patents 2011

Issued Patents 2011

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
7999912 Lithographic apparatus and sensor calibration method Emiel Jozef Melanie Eussen, Stefan Gertrud Marie Hendriks, Erik Roelof Loopstra, Jacob Willem Vink, Ruud Antonius Catharina Maria Beerens +2 more 2011-08-16
7903866 Measurement system, lithographic apparatus and method for measuring a position dependent signal of a movable object Marc Wilhelmus Maria Van Der Wijst, Koen Jacobus Johannes Maria Zaal 2011-03-08