Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6838217 | Define overlay dummy pattern in mark shielding region to reduce wafer scale error caused by metal deposition | Yi-Lin Chen, Szu-Ping Chen | 2005-01-04 |
CH
Chin-Chuan Hsieh
Overall (2005): #224,948 of 245,428Top 95%
1
Patents 2005