Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6965808 | System and method for optimizing metrology sampling in APC applications | Edward W. Conrad, Craig E. Schneider, John S. Smyth | 2005-11-15 |
| 6922600 | System and method for optimizing manufacturing processes using real time partitioned process capability analysis | Edward W. Conrad, Craig E. Schneider, John S. Smyth | 2005-07-26 |