Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6965808 | System and method for optimizing metrology sampling in APC applications | Craig E. Schneider, John S. Smyth, Daniel Sullivan | 2005-11-15 |
| 6949458 | Self-aligned contact areas for sidewall image transfer formed conductors | Chung H. Lam, Dale W. Martin, Edmund J. Sprogis | 2005-09-27 |
| 6922600 | System and method for optimizing manufacturing processes using real time partitioned process capability analysis | Craig E. Schneider, John S. Smyth, Daniel Sullivan | 2005-07-26 |
| 6879719 | Method for measurement of full-two dimensional submicron shapes | David P. Paul | 2005-04-12 |