Issued Patents 2005
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6957373 | Address generator for generating addresses for testing a circuit | Wolfgang Ernst, Justus Kuhn, Jens Luepke, Peter Poechmüller, Gunnar Krause +1 more | 2005-10-18 |
| 6897646 | Method for testing wafers to be tested and calibration apparatus | Thomas Grebner, Hans-Christoph Ostendorf, Erwin Thalmann | 2005-05-24 |
| 6871306 | Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-03-22 |
| 6865707 | Test data generator | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2005-03-08 |
| 6862702 | Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-03-01 |
| 6839397 | Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-01-04 |