Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6897646 | Method for testing wafers to be tested and calibration apparatus | Hans-Christoph Ostendorf, Michael Schittenhelm, Erwin Thalmann | 2005-05-24 |
| 6882139 | Electronic component, tester device and method for calibrating a tester device | Erwin Thalmann | 2005-04-19 |