Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6960523 | Method of reducing erosion of a nitride gate cap layer during reactive ion etch of nitride liner layer for bit line contact of DRAM device | Prakash Dev, David M. Dobuzinsky, Johnathan E. Faltermeier, Thomas Rupp, Chienfan Yu +3 more | 2005-11-01 |
| 6909152 | High density DRAM with reduced peripheral device area and method of manufacture | Brian Cousineau, Guenter Gerstmeier, Jon Berry, Steven Baker, Jinhwan Lee | 2005-06-21 |
| 6890815 | Reduced cap layer erosion for borderless contacts | Johnathan E. Faltermeier, Jeremy K. Stephens, David M. Dobuzinsky, Larry Clevenger, Munir D. Naeem +3 more | 2005-05-10 |
| 6870211 | Self-aligned array contact for memory cells | Rama Divakaruni, Johnathan E. Faltermeier, Jay William Strane | 2005-03-22 |
| 6847092 | Microelectronic capacitor structure with radial current flow | Malati Hegde, Guenter Gerstmeier, Jinwhan Lee, Steven Baker, Jon Berry +2 more | 2005-01-25 |