EM

Eckhard Marx

FS Freeescale Semiconductor: 1 patents #149 of 477Top 35%
Infineon Technologies Ag: 1 patents #412 of 1,152Top 40%
IK Infineon Technologies Sc 300 Gmbh & Co. Kg: 1 patents #6 of 15Top 40%
NC Nanophotonics Co.: 1 patents #2 of 4Top 50%
📍 Halle (Saale), DE: #1 of 5 inventorsTop 20%
Overall (2005): #24,769 of 245,428Top 15%
3
Patents 2005

Issued Patents 2005

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
6935201 Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locations Michael Abraham 2005-08-30
6914006 Wafer scribing method and wafer scribing device Martin Peiter, Karl Mautz 2005-07-05
6866200 Semiconductor device identification apparatus Martin Peiter 2005-03-15