Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6924482 | Method of inspecting pattern and inspecting instrument | Mari Nozoe, Mitsuo Suga, Hidetoshi Nishiyama | 2005-08-02 |
| 6859060 | Inspection method of semiconductor device and inspection system | Mari Nozoe | 2005-02-22 |