Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6908775 | Method for performing an alignment measurement of two patterns in different layers on a semiconductor wafer | Sebastian Schmidt, Thorsten Schedel | 2005-06-21 |
RH
Rolf Heine
Overall (2005): #112,864 of 245,428Top 50%
1
Patents 2005